报告题目：Reliability of Compact Power Systems

  报告人：Krishna Shenai, PhD,University of Chicago

  邀请人：汪飞教授

  时间：2019年5月17日(周五)上午10:15

  地点：1066vip威尼斯宝山校区东区9号机自大楼伯时会堂322

  报告摘要：

     The field-reliability of a power electronics switching converter is among the least understood topics today. There are no established guidelines available for the design and manufacture of high-performance low-cost power converters in order to guarantee prescribed mean-time-between-failure (MTBF) in a given end application. This is particularly important when developing next-generation compact power systems based on advanced silicon and emerging wide bandgap (WBG) power devices. This talk will discuss the current approach followed in industry for assessing the field-reliability of power converters, present extensive experimental results of compact high-end computer power supplies with MTBF of 1 million hours, and outline a novel power converter design and manufacturing approach that emphasizes on “physics-based” component failure mechanisms.

  报告人简介：

     Krishna Shenai earned his B. Tech. (electronics) degree from IIT-Madras in 1979, MS (EE) degree from the University of Maryland – College Park, Maryland (USA) in 1981, and PhD (EE) degree from Stanford University, Stanford, California (USA) in 1986. For nearly 40 years, Dr. Shenai and his students have made seminal contributions to silicon and wide bandgap (WBG) power electronics technologies that have shaped the world-wide industry. He is a Fellow of IEEE, a Fellow of American Association for the Advancement of Science (AAAS), a Fellow of the American Physical Society (APS), and a member of the Academy of Engineers of Serbia (AES). Dr. Shenai currently serves as a Distinguished Lecturer of IEEE Power Electronics Society (PELS) and as an Editor of IEEE J. Electron Devices Society (EDS). He has authored over 400 peer-reviewed archived papers in top international conference digests and journals, 10 books, 9 book chapters, and holds 12 issued US patents.