报告题目:Probing of Local Multifield Coupling Phenomena of Advanced Materials by Scanning Probe Microscopy Techniques
报告人:Prof. Zeng Kaiyang 新加坡国立大学机械工程系
报告时间:2020年10月20日(周二)18:00-22:00
报告地点:腾讯会议
会议链接:https://meeting.tencent.com/s/qS8uAD5K1ZF5
会议ID:377 967 700
Abstract:
Understanding the multi-physical field coupling behavior of the materials from local to macro-scale have great importance in both scientific research and practical applications, as the materials are not usually not subjected to a single physical field. This talk will summarize my group’s work on characterize multifield coupling phenomena of advanced materials in the past decade. We have applied numbers of advanced Scanning Probe Microscopy (SPM) based techniques to characterize various coupling behavior under the combination of the electric, mechanical, and chemical field, namely electromechanical coupling, electrochemical coupling etc. We will show numbers of application examples of conductivity, elasticity, resistive switching, electrochemical induced deformation in battery materials and others by using the advanced SPM techniques. At the end of talk, I will also show the application of the Machine Learning and Big data Analysis to the SPM image analysis as well as some of the new development at my group at NUS.
Zeng Kaiyang教授简介:
Prof. Zeng Kaiyang currently is deputy head of Department of Mechanical Engineering, National University of Singapore (NUS), responsible for postgraduate matter at department. Prof. Zeng, as the first batch students after “Gaokao” resumed in 1977, graduated from Hunan University, major in Ceramic Materials. Prof. Zeng obtained his Ph.D in Materials Science and Engineering from Royal Institute of Technology (KTH) in Sweden. He joint NUS on 2004. Prof. Zeng has conducted many research works on the areas of “Mechanical Properties of Ceramic Composites”; “Nanoindentation analysis and applications”, “Materials Failure”. His currently research area at NUS is focused on “Local Multifield coupling phenomena of advanced materials using Scanning Probe Microscopy techniques”. At NUS, he has graduated nearly 20 Ph.D and M. Eng. students, published more than 200 papers in the high-impact international journals with cross-citation of more than 5000 and H-index of 47. He has also given many invited presentations in the international conferences in China, US, Australia, Europe etc.